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Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
Description
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
A drawing notation and interpretation is provided for the following additional areal terms: Sa
2) control of drainage
in the case of two or more quality characteristics
adapting and changing with experiences gained
It gives guidance on establishing
This method can be applied when:
and packaging of screws having hexagonal drive connection
Organizations providing system and software support
Manufacturers of class B and C single-mode fibres
cushion by articular with a synovial joint capsule
PD CEN/TS 419221-2 gives labelling and descriptive information necessary for registering the Protection Profile
Re-usable containers and re-usable drinking accessories
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